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Related Concept Videos

Fault Types01:18

Fault Types

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When analyzing a single line-to-ground fault from phase A to ground at a three-phase bus, it is important to consider the fault impedance. This impedance is zero for a bolted fault, equal to the arc impedance for an arcing fault, and represents the total fault impedance for a transmission-line insulator flashover. To derive sequence and phase currents, fault conditions are translated from the phase domain to the sequence domain.
For line-to-line faults occurring between phases B and C, the...
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The Nucleosome Core Particle02:10

The Nucleosome Core Particle

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Nucleosomes are the DNA-histone complex, where the DNA strand is wound around the histone core. The histone core is an octamer containing two copies of H2A, H2B, H3, and H4 histone proteins.
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The Nucleosome Core Particle01:12

The Nucleosome Core Particle

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Nucleosomes are the DNA-histone complex, where the DNA strand is wound around the histone core. The histone core is an octamer containing two copies of H2A, H2B, H3, and H4 histone proteins.
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Thermal Strain01:19

Thermal Strain

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Thermal strain is a concept that arises when we consider how temperature changes affect structures. Unlike the conventional assumption that structures remain constant under load, real-world scenarios often involve temperature fluctuations that can significantly impact these structures. Consider a homogeneous rod with a uniform cross-section resting freely on a flat horizontal surface. If the rod's temperature increases, the rod elongates. This elongation is proportional to the temperature...
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Shearing Strain01:20

Shearing Strain

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The shearing strain represents a cubic element's angular change when subjected to shearing stress. This type of stress can transform a cube into an oblique parallelepiped without influencing normal strains. The cubic element experiences a significant transformation when exposed solely to shearing stress. Its shape alters from a perfect cube into a rhomboid, clearly demonstrating the effect of shearing strain. The degree of this strain is considered positive if it reduces the angle between the...
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Measurements of Strain01:27

Measurements of Strain

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Strain quantifies the deformation of a material under force, typically measured as normal strain, which represents the change in length when compared with the original length. Electrical strain gauges are used for enhanced accuracy. These devices consist of a conductive wire mounted on a paper backing that adheres to the material's surface. These gauges operate on the piezoresistive effect, where the wire's electrical resistance changes in response to mechanical deformation. The strain...
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Related Experiment Video

Updated: Feb 12, 2026

Photochemical Oxidative Growth of Iridium Oxide Nanoparticles on CdSe@CdS Nanorods
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Photochemical Oxidative Growth of Iridium Oxide Nanoparticles on CdSe@CdS Nanorods

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Strain-Driven Stacking Faults in CdSe/CdS Core/Shell Nanorods.

Arnaud Demortière1,2,3, Donovan N Leonard4, Valeri Petkov5

  • 1Center for Nanoscale Materials , Argonne National Laboratory , 9700 South Cass Avenue , Argonne , Illinois 60439 , United States.

The Journal of Physical Chemistry Letters
|March 29, 2018
PubMed
Summary
This summary is machine-generated.

Smaller CdSe cores with CdS shells lead to fewer defects. Larger, elongated CdSe cores with CdS shells develop significant strain and stacking faults in nanocrystals.

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Area of Science:

  • Materials Science
  • Nanotechnology
  • Solid State Physics

Background:

  • Semiconductor nanocrystals with core/shell structures enhance properties like photoluminescence.
  • Lattice mismatch between core and shell materials can induce strain and defects.

Purpose of the Study:

  • Investigate how core size and shape influence stacking fault formation in CdSe/CdS core/shell nanorods.
  • Understand the relationship between core dimensions and strain-induced defects.

Main Methods:

  • High-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM).
  • Pair-distribution-function (PDF) analysis of synchrotron X-ray scattering data.
  • Systematic variation of Cadmium Selenide (CdSe) core dimensions (size and shape).

Main Results:

  • CdS shell growth on smaller, spherical CdSe cores resulted in minimal strain and few stacking faults.
  • CdS shell growth on larger, prolate spheroidal CdSe cores induced significant lattice strain.
  • A high density of stacking faults was observed in nanocrystals with larger, elongated CdSe cores.

Conclusions:

  • Core size and shape critically influence strain and defect formation in core/shell nanocrystals.
  • Optimizing core dimensions can mitigate strain and reduce stacking faults in CdSe/CdS nanorods.
  • Findings provide insights for designing high-quality semiconductor nanocrystals with tailored properties.