Semiconductors
Types of Semiconductors
Plastic Deformations
Plastic Deformations
Metal-Semiconductor Junctions
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Updated: Feb 12, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
1Center for Nanoparticle Research of the Institute for Basic Science (IBS), School of Chemical and Biological Engineering, Seoul National University, Seoul, Republic of Korea. dkim98@snu.ac.kr.
No abstract available in PubMed .