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Analog Figure-of-Merits Comparison of Gate Workfunction Variability and Random Discrete Dopant Between Inversion-Mode

Jiwon Kim1, Hyeongwan Oh1, Bo Jin1

  • 1Department of Electrical Engineering, Pohang University of Science and Technology (POSTECH), Pohang 37673, Korea.

Journal of Nanoscience and Nanotechnology
|April 22, 2018
PubMed

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