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Measurements of Long-range Electronic Correlations During Femtosecond Diffraction Experiments Performed on Nanocrystals of Buckminsterfullerene
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Electron diffraction covering a wide angular range from Bragg diffraction to small-angle diffraction.

Hiroshi Nakajima1, Atsuhiro Kotani1, Ken Harada1,2

  • 1Department of Materials Science, Osaka Prefecture University, Sakai, Osaka 599-8531, Japan.

Microscopy (Oxford, England)
|April 28, 2018
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Summary
This summary is machine-generated.

This study presents a novel electron optical system for detailed Bragg diffraction analysis. The method enables extensive angular range observation, aiding in the characterization of magnetic microstructures in various materials.

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Area of Science:

  • Materials Science
  • Condensed Matter Physics
  • Electron Microscopy

Background:

  • Bragg diffraction analysis requires precise control of electron optics.
  • Observing magnetic microstructures necessitates advanced electron diffraction techniques.

Purpose of the Study:

  • To develop an electron optical system for investigating Bragg diffraction over an extensive angular range.
  • To enable dark-field imaging and magnetic-field dependent electron diffraction analysis.
  • To apply the method for analyzing magnetic microstructures in diverse materials.

Main Methods:

  • Constructing an electron optical system with the objective lens turned off.
  • Adjusting intermediate lens currents to locate a crossover on the selected-area aperture plane.
  • Utilizing selected-area apertures for dark-field imaging of Bragg diffraction spots.
  • Controlling camera length (0.8-4 m) and switching to small-angle electron diffraction (>100 m).

Main Results:

  • Achieved dark-field imaging of Bragg diffraction spots.
  • Enabled camera length control without objective lens excitation.
  • Observed magnetic-field dependence of electron diffraction under weak objective lens excitation.
  • Successfully acquired electron diffraction patterns across an angular range of 10^-2 to 10^-7 rad.

Conclusions:

  • The developed electron optical system facilitates extensive angular range electron diffraction analysis.
  • This method is effective for characterizing magnetic microstructures in materials like BaFe10.35Sc1.6Mg0.05O19, Ni-Mn-Ga, and Ba0.5Sr1.5Zn2Fe12O22.