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Updated: Feb 10, 2026

Visualization of Organelles In Situ by Cryo-STEM Tomography
Published on: June 23, 2023
EDS tomographic reconstruction regularized by total nuclear variation joined with HAADF-STEM tomography
Zhichao Zhong1, Willem Jan Palenstijn1, Jonas Adler2
1Centrum Wiskunde & Informatica, Amsterdam, The Netherlands.
Accurate 3D compositional mapping using energy-dispersive X-ray spectroscopy (EDS) tomography is improved by combining it with high-angle annular dark-field STEM (HAADF-STEM) tomography. This novel approach enhances image quality even with limited data, overcoming current limitations in nanostructure analysis.
Area of Science:
- Materials Science
- Nanotechnology
- Analytical Chemistry
Background:
- Energy-dispersive X-ray spectroscopy (EDS) tomography provides 3D compositional data for nanostructures.
- Current EDS tomography is limited by poor image quality due to low signal-to-noise ratios and insufficient X-ray counts.
- Limited tilt series in EDS tomography hinder accurate reconstruction of nanostructure composition.
Purpose of the Study:
- To develop a method for accurate EDS tomography reconstructions from low-quality data.
- To improve the 3D compositional characterization of nanostructures.
- To overcome the limitations of insufficient X-ray counts and limited tilts in EDS tomography.
Main Methods:
- Augmenting EDS tomography with high-angle annular dark-field STEM (HAADF-STEM) tomography.
- Utilizing total nuclear variation (TNV) regularization for joint reconstruction.
- Encouraging sparse gradients, common edges, and parallel gradients in joint EDS and HAADF reconstructions.
Main Results:
- Achieved more accurate EDS reconstructions compared to non-regularized and total variation methods.
- Demonstrated improved performance even with a small number of tilts.
- Showcased enhanced reconstruction quality with low X-ray counts.
Conclusions:
- The proposed TNV-regularized joint reconstruction significantly enhances EDS tomography accuracy.
- This method effectively addresses the challenges of low signal-to-noise ratios and limited tilt data.
- The technique offers a pathway to more reliable 3D compositional analysis of nanostructures.
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