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Tomographic and multimodal scattering-type scanning near-field optical microscopy with peak force tapping mode
Haomin Wang1, Le Wang1, Devon S Jakob1
1Department of Chemistry, Lehigh University, 6 E Packer Avenue, Bethlehem, PA, 18015, USA.
Nature Communications
|May 23, 2018
Summary
Peak force scattering-type scanning near-field optical microscopy (PF-SNOM) offers direct 3D nanoscale imaging and spectroscopy. This novel technique overcomes limitations of conventional methods, enabling detailed surface analysis and material property mapping.
Area of Science:
- Nanotechnology
- Optical Microscopy
- Spectroscopy
Background:
- Scattering-type scanning near-field optical microscopy (s-SNOM) is crucial for nano-photonic research.
- Conventional s-SNOM lacks direct tomographic information and explicit tip-sample distance measurement.
Purpose of the Study:
- To introduce a novel s-SNOM technique for 3D near-field imaging and spectroscopy.
- To enable direct vertical near-field signal sectioning from sample surfaces.
Main Methods:
- Integration of peak force tapping mode with time-gated light detection.
- Development of Peak Force Scattering-Type Scanning Near-field Optical Microscopy (PF-SNOM).
Main Results:
- PF-SNOM provides direct vertical near-field signal sectioning for 3D imaging and spectroscopy.
- Achieved 5 nm spatial resolution, revealing tip-induced relaxation of surface phonon polaritons.
- Simultaneous measurement of mechanical, electrical, and optical near-field properties.
Conclusions:
- PF-SNOM facilitates advanced 3D nanoscale near-field characterization.
- The technique supports correlative in situ investigations of light-induced effects.
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