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Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

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Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
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Design Example: Forces in Sluice Gate01:11

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In hydraulic engineering, sluice gates are essential for managing water flow through channels, reservoirs, and irrigation systems. Sluice gates, acting as vertical barriers, regulate water by adjusting the gate's opening height, which changes the velocity and pressure of water flowing beneath the gate. Understanding the forces involved is crucial to designing sluice gates that can withstand dynamic pressure differences, especially when the gate is closed or partially open.
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Atomic Orbitals02:44

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An atomic orbital represents the three-dimensional regions in an atom where an electron has the highest probability to reside. The radial distribution function indicates the total probability of finding an electron within the thin shell at a distance r from the nucleus. The atomic orbitals have distinct shapes which are determined by l, the angular momentum quantum number. The orbitals are often drawn with a boundary surface, enclosing densest regions of the cloud.
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Design Example: Application of Archimedes' Principle01:11

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Archimedes' principle is fundamental in analyzing the buoyant force and stability of floating bodies. In this example, a wooden block with a rectangular section floats in seawater. Based on the block's dimensions, its specific gravity and the specific weight of seawater are used to find the volume of water displaced and the center of buoyancy.
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Intermolecular Forces03:13

Intermolecular Forces

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Atoms and molecules interact through bonds (or forces): intramolecular and intermolecular. The forces are electrostatic as they arise from interactions (attractive or repulsive) between charged species (permanent, partial, or temporary charges) and exist with varying strengths between ions, polar, nonpolar, and neutral molecules. The different types of intermolecular forces are ion–dipole, dipole–dipole, hydrogen bonds, and dispersion; among these, dipole–dipole, hydrogen...
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In an atom, the negatively charged electrons are attracted to the positively charged nucleus. In a multielectron atom, electron-electron repulsions are also observed. The attractive and repulsive forces are dependent on the distance between the particles, as well as the sign and magnitude of the charges on the individual particles. When the charges on the particles are opposite, they attract each other. If both particles have the same charge, they repel each other.
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Bacterial Immobilization for Imaging by Atomic Force Microscopy
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Note: Design of FPGA based system identification module with application to atomic force microscopy.

Sayan Ghosal1, Sourav Pradhan2, Murti Salapaka3

  • 1Seagate Technology, Shakopee, Minnesota 55379, USA.

The Review of Scientific Instruments
|June 6, 2018
PubMed
Summary

This study presents a field-programmable gate array (FPGA) implementation for real-time system identification. The system accurately estimates nano-scale material properties using an atomic force microscope (AFM).

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Area of Science:

  • Engineering
  • Materials Science
  • Computational Science

Background:

  • System identification is crucial for modeling complex input-output relationships in various scientific and engineering domains.
  • Real-time estimation of material properties at the nano-scale presents significant computational challenges.

Purpose of the Study:

  • To develop and implement a field-programmable gate array (FPGA) based real-time system identification algorithm.
  • To utilize the FPGA module for estimating mechanical properties of materials at the nano-scale via Atomic Force Microscopy (AFM).
  • To create a user-friendly module interfaceable with commercial AFMs.

Main Methods:

  • Implementation of a system identification algorithm incorporating forgetting factors and bias compensation techniques on an FPGA.
  • Integration of the FPGA module with an Atomic Force Microscope (AFM) for data acquisition and analysis.
  • Validation through extensive simulations and experimental testing.

Main Results:

  • Successful real-time estimation of nano-scale mechanical properties of material surfaces.
  • Demonstration of the FPGA module's user-friendliness and compatibility with commercial AFMs.
  • Validation of the algorithm's accuracy and reliability through comprehensive simulation and experimental data.

Conclusions:

  • The developed FPGA-based system identification module offers an efficient and accurate solution for real-time nano-scale material characterization.
  • The user-friendly interface and compatibility with commercial AFMs facilitate broader application in materials science research.
  • The design is robust and validated, paving the way for advanced applications in surface metrology.