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This study details the structural and morphological changes in bismuth vanadate (BiVO4) thin films. We explored how synthesis methods and deposition conditions influence film crystallinity and morphology.

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Area of Science:

  • Materials Science
  • Solid State Chemistry

Background:

  • Bismuth vanadate (BiVO4) is a promising material for various applications, including photocatalysis and solar cells.
  • Controlling the structure and morphology of BiVO4 thin films is crucial for optimizing their performance.

Purpose of the Study:

  • To investigate the structural and morphological modulation of rf-sputtered BiVO4 thin films.
  • To correlate synthesis parameters with the resulting film properties.

Main Methods:

  • Thin films were deposited using radio frequency (rf) sputtering with mechanochemically synthesized BiVO4 nano-powders as targets.
  • In-situ high-temperature X-ray diffraction (HT-XRD) was employed to monitor the crystalline nature (amorphous to crystalline) over time and temperature.
  • Fourier transform infrared (FT-IR) spectroscopy was used to analyze the annealed thin films.
  • Morphological characterization was performed for films deposited at various substrate temperatures.

Main Results:

  • The study presents data on the crystalline evolution of BiVO4 films from amorphous to crystalline states.
  • FT-IR spectra confirm the monoclinic BiVO4 structure after annealing.
  • Correlations between substrate temperature during deposition and the resulting film morphologies are provided.

Conclusions:

  • The data article provides a comprehensive overview of the structural and morphological characteristics of BiVO4 thin films.
  • Understanding these structure-property relationships is essential for the targeted design of BiVO4-based devices.