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Nondestructive, fast, and cost-effective image processing method for roughness measurement of randomly rough metallic
Abstract:
In recent years, various surface roughness measurement methods have been proposed as alternatives to the commonly used stylus profilometry, which is a low-speed, destructive, expensive but precise method. In this study, a novel method, called "image profilometry," has been introduced for nondestructive, fast, and low-cost surface roughness measurement of randomly rough metallic samples based on image processing and machine vision. The impacts of influential parameters such as image resolution and filtering approach for elimination of the long wavelength surface undulations on the accuracy of the image profilometry results have been comprehensively investigated. Ten surface roughness parameters were measured for the samples using both the stylus and image profilometry. Based on the results, the best image resolution was 800 dpi, and the most practical filtering method was Gaussian convolution+cutoff. In these conditions, the best and worst correlation coefficients (R2) between the stylus and image profilometry results were 0.9892 and 0.9313, respectively. Our results indicated that the image profilometry predicted the stylus profilometry results with high accuracy. Consequently, it could be a viable alternative to the stylus profilometry, particularly in online applications.
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