Surface elemental microanalysis with submicron lateral resolution by the laser-ablation laser-induced fluorescence...

Area of Science:

• Analytical Chemistry
• Materials Science
• Spectroscopy

Background:

• Surface elemental microanalysis requires high spatial resolution for detailed material characterization.
• Traditional methods often lack the necessary precision for submicron analysis of solid samples.
• Laser-induced fluorescence (LIF) offers high sensitivity for detecting trace elements.

Purpose of the Study:

• To investigate the feasibility of laser-ablation (LA) coupled with laser-induced fluorescence (LIF) for submicron surface elemental microanalysis.
• To achieve high spatial resolution in elemental analysis of solid samples.
• To demonstrate the detection of minor elements using the LA-LIF technique.

Main Methods:

• Utilized a 532 nm or 266 nm nanosecond laser pulse with low pulse energy for submicron laser-ablation.
• Employed laser-induced fluorescence (LIF) for sensitive detection of lead in ablated copper alloy samples.
• Investigated the lateral resolution achievable with different laser wavelengths.

Main Results:

• Achieved experimental lateral resolutions of approximately 344 nm and 267 nm using 532 nm and 266 nm laser ablations, respectively.
• Demonstrated the capability of the LA-LIF technique for surface elemental microanalysis with submicron spatial resolution.
• Successfully detected a minor lead element in a copper alloy sample.

Conclusions:

• The LA-LIF technique is feasible for surface elemental microanalysis of solid samples with submicron spatial resolution.
• The developed method shows potential for further improvement towards nanoscale spatial resolution.
• This technique offers a promising approach for high-resolution elemental mapping of materials.