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Area of Science:

  • Solid State Physics
  • Nanomechanics
  • Optomechanics

Background:

  • High-frequency optomechanical resonators are crucial for sensitive measurements.
  • Understanding nanomechanical dissipation is key to improving device performance.
  • Gallium arsenide (GaAs) is a promising material for optomechanical devices.

Purpose of the Study:

  • To systematically investigate nanomechanical dissipation in GaAs optomechanical disk resonators.
  • To identify the dominant sources of dissipation at high frequencies (≈300 MHz).
  • To correlate dissipation mechanisms with microscopic properties and surface effects.

Main Methods:

  • Fabrication of high-frequency GaAs optomechanical disk resonators.
  • Measurements of mechanical dissipation at cryogenic (3 K) and room temperatures (300 K).
  • Analysis using phonon-phonon interaction models and two-level system (TLS) models.
  • Surface modification via atomic layer deposition (ALD) of alumina.

Main Results:

  • Phonon-phonon interactions contribute a temperature-dependent loss background, diminishing at cryogenic temperatures.
  • Surface dissipation is significant, as evidenced by changes in quality factor after alumina ALD.
  • The temperature dependence of dissipation is accurately described by TLS models.
  • TLS, particularly at surfaces, are identified as the primary cause of damping and fluctuations.

Conclusions:

  • Nanomechanical dissipation in GaAs optomechanical resonators is governed by microscopic properties, specifically TLS.
  • Surface-localized TLS play a critical role in damping and fluctuations from 3 K to 300 K.
  • Minimizing TLS, especially at surfaces, is essential for enhancing the performance of high-quality crystalline nanomechanical devices.