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Protein Crystallization for X-ray Crystallography
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Delayed Onset of Nonthermal Melting in Single-Crystal Silicon Pumped with Hard X Rays
T Pardini1, J Alameda1, A Aquila2
1Lawrence Livermore National Laboratory, 7000 East Avenue, Livermore, California 94550, USA.
Physical Review Letters
|July 14, 2018
Summary
Researchers observed nonthermal melting in silicon using X-ray techniques. The study found a delay before atomic disorder, indicating electronic equilibration, followed by rapid melting.
Area of Science:
- Materials Science
- Condensed Matter Physics
- Ultrafast Phenomena
Background:
- Nonthermal melting is a non-equilibrium phase transition.
- Understanding the dynamics of melting is crucial for materials processing and fundamental physics.
Purpose of the Study:
- To investigate the onset and dynamics of nonthermal melting in single-crystal silicon.
- To determine the temporal evolution of atomic order during ultrafast laser-induced melting.
Main Methods:
- Utilized an X-ray pump-X-ray probe spectroscopy scheme.
- Employed ultrashort X-ray pulses from the Linac Coherent Light Source (SLAC).
- Implemented a custom-built split-and-delay line for high temporal resolution.
Main Results:
- Observed no loss of long-range atomic order for 150±40 femtoseconds (fs) after photoabsorption.
- Interpreted this delay as the time for the electronic system to reach critical nonthermal melting temperature.
- Found that the loss of long-range order occurs inertially, completing within 315±40 fs.
Conclusions:
- The electronic system equilibrates before the onset of nonthermal melting.
- Atomic disordering proceeds ballistically/inertially once the critical temperature is reached.
- This study provides critical insights into the fundamental mechanisms of ultrafast phase transitions in solids.
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