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Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

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A ray tracing method for predicting contrast in neutral atom beam imaging.

S M Lambrick¹, M Bergin¹, A P Jardine¹

¹Department of Physics, The Cavendish Laboratory, University of Cambridge, Cambridge CB3 0HE, UK.

Micron (Oxford, England : 1993)

|July 16, 2018

Summary

This summary is machine-generated.

A novel ray tracing method simulates atom beam imaging contrast. This computational approach, applied to the scanning helium microscope, accurately predicts image formation and scattering effects for enhanced microscopy applications.

Keywords:

Atomic microscopy Helium atom scattering Ray tracing Scanning helium microscopy Simulated imaging

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Area of Science:

Physics
Materials Science
Computational Science

Background:

Atom beam imaging techniques are crucial for nanoscale analysis.
Understanding image contrast mechanisms in these microscopes is essential for accurate interpretation.
Existing analytical models struggle to incorporate complex phenomena like multiple scattering.

Purpose of the Study:

To develop and present a ray tracing method for predicting contrast in atom beam imaging.
To create computational tools for simulating atom trajectories in microscopes.
To apply this method to the scanning helium microscope (SHeM) and analyze image formation.

Main Methods:

Developed bespoke computational tools using MATLAB and C code.
Simulated classical atom trajectories through microscope elements described by triangulated surface meshes.
Incorporated multiple scattering effects, a limitation of analytic integral models.

Main Results:

Generated simulated images directly analogous to experimental results.
Successfully modeled contrast and shadowing in SHeM images.
Investigated the impact of pinhole-to-sample working distance on image formation.

Conclusions:

Ray tracing provides a powerful method for understanding contrast in atom beam imaging.
The developed tools enable accurate simulation of neutral atom microscopes like SHeM.
This approach has broad applications for microscope design, sample analysis, and experimental data interpretation.