Related Experiment Video
Updated: Oct 6, 2025

High-resolution Episcopic Microscopy HREM - Simple and Robust Protocols for Processing and Visualizing Organic Materials
Published on: July 7, 2017
Standardizing resolution definition in scanning helium microscopy
M Bergin1, W Roland-Batty1, C J Hatchwell1
1Centre for Organic Electronics, University of Newcastle, Callaghan, NSW 2308, Australia.
Abstract:
Resolution is a key parameter for microscopy, but methods for standardizing its definition are often poorly defined. For a developing technique such as scanning helium microscopy, it is critical that a consensus-based protocol for determining instrument resolution is prepared as a written standard to allow both comparable quantitative measurements of surface topography and direct comparisons between different instruments. In this paper we assess a range of quantitative methods for determining instrument resolution and determine their relative merits when applied to the specific case of the scanning helium microscope (SHeM). Consequently, we present a preliminary protocol for measuring the resolution in scanning helium microscopy based upon utilizing appropriate test samples with sets of slits of well-defined dimensions to establish the quantitative resolution of any similar instrument.
Related Concept Videos
Super-resolution Fluorescence Microscopy
Scanning Electron Microscopy
Fundamental Principles
Accelerated...
Overview of Electron Microscopy
Chromatographic Resolution
The effectiveness of separation can be evaluated by determining the level of separation between two neighboring peaks in a chromatogram, which represents the individual components of a sample.
In chromatography,...

