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Updated: Feb 7, 2026

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
Published on: January 19, 2018
Extending the dynamic range of microchannel plate detectors using charge-integration-based counting
Daniel J Gershman1, Levon A Avanov1, Dennis J Chornay1
1NASA Goddard Space Flight Center, Greenbelt, Maryland 20771, USA.
Microchannel plate (MCP) detectors can suffer performance loss at high particle flux. A new model quantifies MCP gain limits, enabling higher effective count rates up to 1 GHz for advanced applications.
Area of Science:
- Physics
- Instrumentation
- Particle Detection
Background:
- Microchannel plate (MCP) detectors generate measurable current pulses when stimulated by particles or photons.
- High incident particle flux can significantly reduce MCP gain, degrading detector performance.
Purpose of the Study:
- To develop a parameterized model for MCP gain variation with incident flux.
- To quantify the operational limits of MCPs under high-flux conditions.
Main Methods:
- A parameterized model was developed to describe MCP gain as a function of incident flux.
- Model predictions were validated against laboratory measurements using a pulsed charged particle beam.
- MCP output current integration was explored for pulsed operation.
Main Results:
- The developed model accurately predicts MCP gain reduction under high flux.
- Laboratory experiments confirmed the model's predictions.
- Integration of MCP output current achieved effective count rates up to approximately 1 GHz.
Conclusions:
- The parameterized model provides a framework for understanding high-flux MCP limitations.
- Effective count rates can be increased by over an order of magnitude compared to conventional techniques.
- This advancement is crucial for spaceflight applications requiring high-rate particle detection.
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