Direct Multielemental Trace Determinations in Plutonium Samples by Total Reflection X-ray Fluorescence Spectrometry...

A simple, safe, and sensitive method for direct multielemental trace determinations in plutonium samples using total reflection X-ray fluorescence (TXRF) spectrometry has been developed. A very small volume (2 μL) of the sample solutions was deposited on TXRF supports after separation of the plutonium matrix from these solutions. Since the amount of the plutonium deposited on the supports was in the ng level only fixed on the supports and the specimen spots were not disturbed during the sample preparation, the samples could be analyzed directly without putting the instrument in a glovebox. This approach avoided a cumbersome operation of the instrument in a glovebox, which is normally utilized for Pu-based samples using other techniques. Similarly, the requirement of small amounts of the samples minimized the radiation dose to the operator as well as a cumbersome problem of management of radioactive analytical waste of plutonium samples. The samples were analyzed using the TXRF spectra of the specimens, concentration of the internal standard Se or Ga and predetermined sensitivity values. The elemental detection limits for the elements K-Sr varied from 1.06 to 0.09 ng. The elements K, Ca, Cr, Mn, Fe, Ni, Cu, Zn, Sr, Ba, Tl, and Pb were analyzed at μg/mL level. The analytical results of TXRF determinations showed average relative standard deviation (RSD) value of 4.5% (1σ, n = 3) and the TXRF determined results deviated from the expected values by 5.9% on average for samples prepared by adding multielements in plutonium solutions. Two real plutonium samples were also analyzed in similar manner. For the real plutonium sample solution the average RSD values of TXRF determinations were 10.6% (1σ, n = 3) for the elemental concentrations in the range of 0.2 to 61 μg/mL. These values are comparable with conventional trace element analytical techniques with added advantages mentioned above.