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Updated: Feb 6, 2026

Method for Recording Broadband High Resolution Emission Spectra of Laboratory Lightning Arcs
Published on: August 27, 2019
High-resolution stigmatic spectrograph for a wavelength range of 12.5-30 nm
We developed a broadband extreme ultraviolet (XUV) spectrograph for detailed plasma analysis. This instrument achieves high spectral resolution and spatial accuracy, enabling precise electron density measurements in laser-produced plasmas.
Area of Science:
- Physics
- Spectroscopy
- Plasma Physics
Background:
- Extreme ultraviolet (XUV) spectroscopy is crucial for analyzing plasma properties.
- Developing instruments with high spectral and spatial resolution is essential for accurate diagnostics.
Purpose of the Study:
- To describe a novel broadband XUV spectrograph.
- To demonstrate its capability in recording space-resolved spectra of laser-produced plasmas.
- To evaluate electron density using Stark broadening.
Main Methods:
- Utilized a near-normal-incidence aperiodic Mo/Si multilayer mirror.
- Employed a grazing-incidence plane varied line-space (VLS) grating.
- Recorded vertically space-resolved line spectra of multiply charged ions.
Main Results:
- Achieved stigmatism throughout the 12.5-30 nm operating range.
- Demonstrated a spectral resolving power of 10^3 and spatial resolution of ~26 μm.
- Evaluated electron density from Stark broadening of C VI Hβ line (135 Å).
Conclusions:
- The developed XUV spectrograph is effective for plasma diagnostics.
- The instrument provides high spectral and spatial resolution for detailed analysis.
- Stark broadening measurements offer a reliable method for electron density determination in laser plasmas.
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