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Updated: Feb 6, 2026

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
08:12

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures

Published on: December 5, 2015

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Mapping the electric field distribution of tightly focused cylindrical vector beams with gold nanorings

J Fulmes, D A Gollmer, S Jäger

    Optics Express
    |August 18, 2018
    PubMed

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