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Updated: Feb 6, 2026

Implementation of a Reference Interferometer for Nanodetection
Published on: April 26, 2014
Multiwavelength wavefront detection based on a lateral shear interferometer and polarization phase-shifting
Abstract:
We present a multiwavelength analysis of a wavefront detected by a color camera and a lateral shear interferometer. The system employs polarization phase-shifting techniques by rotating a linear polarizer at the output and detecting the phase information through a frequency demodulation algorithm. By considering the phase modulation obtained by rotating the analyzer, a frequency filter centered on the desired peak carries the phase and amplitude information of the detected wavefront. Theoretical approach, the consideration of Jones matrices of each element, and experimental results show the feasibility of the implementation.
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