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Sub-microsecond-resolved multi-speckle X-ray photon correlation spectroscopy with a pixel array detector.

Qingteng Zhang1, Eric M Dufresne1, Suresh Narayanan1

  • 1X-ray Science Division, Argonne National Laboratory, 9700 South Cass Avenue, Lemont, IL 60439, USA.

Journal of Synchrotron Radiation
|September 5, 2018
PubMed
Summary
This summary is machine-generated.

This study introduces a new photon-counting pixel array detector for small-angle X-ray photon correlation spectroscopy (XPCS). The detector achieves broad time-scale resolution, crucial for studying dynamics in materials science.

Keywords:
X-ray photon correlation spectroscopy (XPCS)multi-speckle XPCSpixel array detector (PAD)

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Area of Science:

  • Materials Science
  • Condensed Matter Physics
  • Photonics

Background:

  • Small-angle X-ray photon correlation spectroscopy (XPCS) requires detectors with high dynamic range and temporal resolution.
  • Existing detectors may struggle to capture dynamics across a wide range of timescales.

Purpose of the Study:

  • To evaluate a novel photon-counting pixel array detector for XPCS applications.
  • To assess the detector's ability to measure dynamics over extended time scales (ns to s).
  • To validate the detector's performance using standard colloidal systems.

Main Methods:

  • Utilized a photon-counting pixel array detector with 2-bit dynamic range.
  • Employed two operational modes: continuous and burst mode, to achieve fine temporal resolution.
  • Performed multi-speckle XPCS on gold and silica colloids in water.

Main Results:

  • Successfully measured Brownian dynamics of gold and silica nanoparticles.
  • Demonstrated the detector's capability to cover time scales from 826 ns to 52.8 s.
  • Identified a discrepancy in two-photon counts in burst mode, attributed to pixel dead-time.

Conclusions:

  • The developed detector is suitable for multi-speckle XPCS, offering broad time-scale coverage.
  • Pixel response dead-time is a critical factor affecting count statistics in burst mode.
  • This technology advances XPCS capabilities for studying dynamic processes in materials.