Preparation of surfaces of composite samples for tip based micro-analyses using ion beam milling

Ion beam milling, as a method of surface design for tip analytical techniques, was explored. A sample of clay, embedded in a resin, was treated by the ion beam and allowed AFM (a typical tip technique) to be successfully applied. The method is suitable for advanced tip analyses based on AFM, like TERS or SNOM, and for samples that are not possible to prepare by standard mechanical methods. The approach can be useful for characterisation of the surfaces of many different types of materials in versatile applications such as catalysis, corrosion science or advanced material characterisation.