Related Experiment Video
Updated: Feb 5, 2026

Design and Characterization Methodology for Efficient Wide Range Tunable MEMS Filters
Published on: February 4, 2018
Thermomechanical Noise Characterization in Fully Monolithic CMOS-MEMS Resonators
Rafel Perelló-Roig1, Jaume Verd2, Sebastià Bota3
1System Electronic Group (Physics Department), Universitat de les Illes Balears, 07122 Palma (Balearic Islands), Spain. rafel.perello@uib.es.
Abstract:
We analyzed experimentally the noise characteristics of fully integrated CMOS-MEMS resonators to determine the overall thermomechanical noise and its impact on the limit of detection at the system level. Measurements from four MEMS resonator geometries designed for ultrasensitive detection operating between 2-MHz and 8-MHz monolithically integrated with a low-noise CMOS capacitive readout circuit were analyzed and used to determine the resolution achieved in terms of displacement and capacitance variation. The CMOS-MEMS system provides unprecedented detection resolution of 11 yF·Hz-1/2 equivalent to a minimum detectable displacement (MDD) of 13 fm·Hz-1/2, enabling noise characterization that is experimentally demonstrated by thermomechanical noise detection and compared to theoretical model values.
Related Concept Videos
Resonance
Series Resonance
Parallel Resonance
Sound Waves: Resonance
Resonance and Hybrid Structures
Resonance Structures and Resonance Hybrids
The Lewis structure of a nitrite anion (NO2−) may actually be drawn in two different ways, distinguished by the locations of the N–O and N=O bonds.
Magnetic Resonance Imaging

