A new precise positioning method for piezoelectric scanner of AFM
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Updated: Feb 4, 2026

Quantitative Hardness Measurement by Instrumented AFM-indentation
Published on: November 22, 2016
Yanyan Wang1, Sen Wu2, Linyan Xu2
1Tianjin Key Laboratory of Information Sensing and Intelligent Control, Tianjin University of Technology and Education, 300222 Tianjin, China.
Abstract:
Atomic Force Microscopy (AFM) plays a vital role in nanoscience and nanotechnology due to its nanoscale resolution. However, the realization of highly precise measurement for AFM is still a challenge. A main factor is the positioning accuracy of the piezoelectric scanner (PZT), affected significantly by the hysteresis of PZT. The paper reports a new dynamic polynomial fitting method modeling hysteresis to achieve the inverse model of the PZT. The inverse model is used as the feedforward input, combined with the fuzzy feedback controller proposed in our former paper, to correct the nonlinear errors induced by the hysteresis. The method is demonstrated to be effective in improving the positioning accuracy of the lateral PZT. Its accuracy can achieve 1 nm.
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