A new precise positioning method for piezoelectric scanner of AFM

Yanyan Wang1, Sen Wu2, Linyan Xu2

  • 1Tianjin Key Laboratory of Information Sensing and Intelligent Control, Tianjin University of Technology and Education, 300222 Tianjin, China.

Ultramicroscopy
|October 6, 2018
PubMed
Summary

This study introduces a novel dynamic polynomial fitting method to model and compensate for piezoelectric scanner (PZT) hysteresis in Atomic Force Microscopy (AFM). This significantly enhances PZT positioning accuracy for high-precision nanoscale measurements.

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