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Updated: Feb 4, 2026

Quantitative Hardness Measurement by Instrumented AFM-indentation
Published on: November 22, 2016
A new precise positioning method for piezoelectric scanner of AFM
Yanyan Wang1, Sen Wu2, Linyan Xu2
1Tianjin Key Laboratory of Information Sensing and Intelligent Control, Tianjin University of Technology and Education, 300222 Tianjin, China.
This study introduces a novel dynamic polynomial fitting method to model and compensate for piezoelectric scanner (PZT) hysteresis in Atomic Force Microscopy (AFM). This significantly enhances PZT positioning accuracy for high-precision nanoscale measurements.
Area of Science:
- Nanoscience and Nanotechnology
- Metrology
- Control Systems Engineering
Background:
- Atomic Force Microscopy (AFM) is crucial for nanoscale imaging and manipulation.
- Achieving high-precision measurements in AFM is limited by the positioning accuracy of piezoelectric scanners (PZT).
- PZT hysteresis introduces significant nonlinear errors, challenging precise positioning.
Purpose of the Study:
- To develop a method for modeling and compensating PZT hysteresis.
- To improve the positioning accuracy of the lateral PZT in AFM systems.
- To achieve nanoscale measurement precision.
Main Methods:
- A new dynamic polynomial fitting method was developed to model PZT hysteresis.
- An inverse model of the PZT was created using the dynamic polynomial fitting.
- The inverse model was integrated as a feedforward input with a fuzzy feedback controller.
Main Results:
- The dynamic polynomial fitting method effectively models PZT hysteresis.
- The combined feedforward and feedback control strategy significantly corrects nonlinear errors.
- The positioning accuracy of the lateral PZT was improved, achieving 1 nm accuracy.
Conclusions:
- The proposed method successfully compensates for PZT hysteresis.
- This advancement enhances the precision of AFM measurements.
- The technique offers a pathway to highly accurate nanoscale positioning.
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