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Ultramicroscopy|October 6, 2018
A new precise positioning method for piezoelectric scanner of AFMYanyan Wang, Sen Wu, Linyan Xu, et al.
Ultramicroscopy|May 6, 2015
A rate adaptive control method for Improving the imaging speed of atomic force microscopyYanyan Wang, Jiahuan Wan, Xiaodong Hu, et al.
Sensors (Basel, Switzerland)|March 13, 2015
Accurate calibration and uncertainty estimation of the normal spring constant of various AFM cantileversYunpeng Song, Sen Wu, Linyan Xu, et al.
Sensors (Basel, Switzerland)|December 10, 2014
Investigation on blind tip reconstruction errors caused by sample featuresJiahuan Wan, Linyan Xu, Sen Wu, et al.
Ultramicroscopy|November 13, 2012
Improving the scanning speed of atomic force microscopy at the scanning range of several tens of micrometersYanyan Wang, Xiaodong Hu, Linyan Xu, et al.
Scientific Reports|September 27, 2025
Simultaneous measurements of microplastic 3D morphology and naphthalene adsorption based on digital holographic microscopyChangqing Li, Yanan Zeng, Xiaodong Hu, et al.
ACS Applied Materials & Interfaces|July 18, 2018
Implementing Lateral MoSe2 P-N Homojunction by Efficient Carrier-Type ModulationShuangqing Fan, Wanfu Shen, Chunhua An, et al.
Nanotechnology|January 10, 2022
Dielectric engineering enable to lateral anti-ambipolar MoTeheterojunctionGuangyu Geng, Enxiu Wu, Linyan Xu, et al.
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