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Related Experiment Video

Updated: Feb 3, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

Published on: October 11, 2016

A quick convergent-beam laboratory X-ray reflectometer using a simultaneous multiple-angle dispersive geometry.

Wolfgang Voegeli¹, Chika Kamezawa^1,2, Etsuo Arakawa¹

¹Department of Physics, Tokyo Gakugei University, 4-1-1 Nukuikita-machi, Koganei, Tokyo 184-8501, Japan.

Journal of Applied Crystallography

|October 16, 2018

Summary

This study introduces a novel X-ray reflectometer for rapid thin film analysis. The instrument accurately measures specular X-ray reflectivity curves, enabling precise characterization of material surfaces.

Keywords:

characteristic X-rays laboratory X-ray sources specular X-ray reflectivity time-resolved measurement

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Energy Dispersive X-ray Tomography for 3D Elemental Mapping of Individual Nanoparticles

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Last Updated: Feb 3, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

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Published on: October 11, 2016

In situ Grazing Incidence Small Angle X-ray Scattering on Roll-To-Roll Coating of Organic Solar Cells with Laboratory X-ray Instrumentation

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Energy Dispersive X-ray Tomography for 3D Elemental Mapping of Individual Nanoparticles

Energy Dispersive X-ray Tomography for 3D Elemental Mapping of Individual Nanoparticles

Published on: July 5, 2016

Area of Science:

Materials Science
Surface Science
Analytical Chemistry

Background:

Accurate characterization of thin films and surfaces is crucial for materials development.
Traditional X-ray reflectivity methods can be time-consuming and limited by diffuse scattering.
Need for rapid, sensitive techniques for analyzing material interfaces.

Purpose of the Study:

To present a novel laboratory X-ray reflectometer for quick specular X-ray reflectivity measurements.
To demonstrate the instrument's capability for accurate measurement of low reflectivities.
To showcase time-resolved reflectivity measurements.

Main Methods:

Utilized a bent-twisted crystal to monochromatize and focus diverging X-rays (Cu Kα1) from a laboratory point source.
Employed a two-dimensional detector to record reflected X-rays.
Developed a method to separate specularly reflected X-rays from diffuse scattering background without instrument rotation.

Main Results:

Achieved reflectivity measurements down to 10⁻⁶ for a gold thin film on silicon within 100 seconds.
Demonstrated accurate measurement of low reflectivities (down to 10⁻⁵ in 10 seconds).
Successfully measured reflectivity curves for silicon wafers, liquid ethylene glycol, and performed time-resolved measurements on a TiO₂ surface during UV irradiation.

Conclusions:

The developed X-ray reflectometer offers a fast and accurate method for specular reflectivity analysis.
The instrument's ability to suppress diffuse scattering enables precise measurements of low reflectivities.
The system is suitable for various applications, including thin film characterization and in-situ surface studies.