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Updated: Feb 3, 2026

Writing and Low-Temperature Characterization of Oxide Nanostructures
Published on: July 18, 2014
S D Sawtelle1, Z A Kobos2, M A Reed2
1Department of Applied Physics, Yale University, New Haven, CT 06520 United States of America.
Electromigration critical temperature is not fixed, varying with environmental conditions and device geometry. Understanding these factors is crucial for reliable microelectronic device design.
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