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Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

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Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
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Atomic Mass01:52

Atomic Mass

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Atoms — and the protons, neutrons, and electrons that compose them — are extremely small. For example, a carbon atom weighs less than 2 × 10−23 g. When describing the properties of tiny objects such as atoms, we use appropriately small units of measure, such as the atomic mass unit (amu). The amu was originally defined based on hydrogen, the lightest element, then later in terms of oxygen. Since 1961, it has been defined with regard to the most abundant isotope of carbon, atoms of which...
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Atomic Orbitals02:44

Atomic Orbitals

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An atomic orbital represents the three-dimensional regions in an atom where an electron has the highest probability to reside. The radial distribution function indicates the total probability of finding an electron within the thin shell at a distance r from the nucleus. The atomic orbitals have distinct shapes which are determined by l, the angular momentum quantum number. The orbitals are often drawn with a boundary surface, enclosing densest regions of the cloud.
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Intermolecular Forces03:13

Intermolecular Forces

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Atoms and molecules interact through bonds (or forces): intramolecular and intermolecular. The forces are electrostatic as they arise from interactions (attractive or repulsive) between charged species (permanent, partial, or temporary charges) and exist with varying strengths between ions, polar, nonpolar, and neutral molecules. The different types of intermolecular forces are ion–dipole, dipole–dipole, hydrogen bonds, and dispersion; among these, dipole–dipole, hydrogen...
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Ethical Issues01:27

Ethical Issues

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Nurses are essential in patient care, upholding the ethical principles of their profession and effectively navigating ethical dilemmas. Neglecting ethical issues can lead to inadequate patient care, compromised therapeutic relationships, and moral distress among healthcare workers.
Ethical Concerns in Healthcare:
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The Energies of Atomic Orbitals03:21

The Energies of Atomic Orbitals

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In an atom, the negatively charged electrons are attracted to the positively charged nucleus. In a multielectron atom, electron-electron repulsions are also observed. The attractive and repulsive forces are dependent on the distance between the particles, as well as the sign and magnitude of the charges on the individual particles. When the charges on the particles are opposite, they attract each other. If both particles have the same charge, they repel each other.
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Addressing Practical Issues in Atomic Force Microscopy-Based Micro-Indentation on Human Articular Cartilage Explants
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Artifacts and Practical Issues in Atomic Force Microscopy.

Peter Eaton1,2, Krystallenia Batziou3

  • 1Instituto de Medicina Molecular, Faculdade de Medicina, Universidade de Lisboa, Lisbon, Portugal. peter.eaton@medicina.ulisboa.pt.

Methods in Molecular Biology (Clifton, N.J.)
|October 31, 2018
PubMed
Summary
This summary is machine-generated.

Atomic Force Microscopy (AFM) can present challenges from operator error, sample properties, instrument type, or probe damage. This guide details common AFM artifacts and solutions for accurate data interpretation.

Keywords:
ArtifactsDistortionsErrorsForce spectroscopyImagingTechnique

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Area of Science:

  • Microscopy
  • Surface Science
  • Materials Science

Background:

  • Atomic Force Microscopy (AFM) is a powerful tool for nanoscale imaging.
  • However, like all microscopy techniques, AFM is susceptible to various problems and artifacts.
  • Operator training and understanding of potential issues are crucial for effective AFM use.

Purpose of the Study:

  • To identify and illustrate common artifacts encountered in Atomic Force Microscopy.
  • To provide practical guidance on overcoming these artifacts for improved data acquisition.
  • To discuss essential best practices for AFM operation, including noise reduction and data processing.

Main Methods:

  • Review and compilation of common Atomic Force Microscopy artifacts.
  • Illustrative examples of artifact types and their origins.
  • Discussion of strategies for artifact mitigation and troubleshooting.

Main Results:

  • Identified artifacts stemming from operator error, sample characteristics, instrument type, and probe damage.
  • Provided practical solutions and workarounds for common AFM artifacts.
  • Highlighted the importance of adequate training for correct data interpretation.

Conclusions:

  • Understanding and identifying AFM artifacts is critical for reliable data acquisition and interpretation.
  • Proper operational practices and troubleshooting can significantly enhance the quality of AFM results.
  • Addressing common issues leads to more accurate nanoscale surface analysis.