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An accurate theory of X-ray coplanar multiple SRMS diffractometry.

¹National Research Centre `Kurchatov Institute', Kurchatov square 1, 123182 Moscow, Russia.

Acta Crystallographica. Section A, Foundations and Advances

|November 1, 2018

Summary

A new theory for X-ray coplanar multiple diffraction (SRMS diffractometry) accurately models synchrotron radiation sources, monochromators, and slits. This method enables precise measurement of sample reflectivity, approaching monochromatic plane wave conditions.

Keywords:

X-ray diffraction multiple diffraction silicon crystal slit diffraction synchrotron radiation

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Area of Science:

Physics
Materials Science
Crystallography

Background:

Synchrotron radiation (SR) is crucial for advanced diffraction studies.
Accurate theoretical models are needed to interpret complex experimental setups.

Purpose of the Study:

To develop an accurate theory for X-ray coplanar multiple diffraction using SR.
To analyze the impact of monochromators and slits on diffraction measurements.

Main Methods:

Developed a theory for X-ray coplanar multiple SRMS diffractometry.
Accounted for SR properties and diffraction in monochromator crystals and slits.
Analyzed angular and energy dependence (AED) of sample reflectivity.

Main Results:

Sample reflectivity is a convolution of monochromatic wave AED and instrumental function.
The scheme allows near-monochromatic plane wave conditions using high-order reflections.
Detailed analysis of four-beam diffraction in Silicon.

Conclusions:

The SRMS diffractometry theory provides a robust framework for high-precision X-ray diffraction.
This approach enhances the ability to study material properties through detailed reflectivity analysis.