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Updated: Feb 3, 2026

Fabrication of Silica Ultra High Quality Factor Microresonators
Published on: July 2, 2012
Investigation on the Quality Factor Limit of the (111) Silicon Based Disk Resonator
Xin Zhou1,2, Dingbang Xiao3, Qingsong Li4
1College of Mechatronics Engineering and Automation, National University of Defense Technology, Changsha 410073, China. xz387@cam.ac.uk.
Abstract:
Quality factor is one of the most important parameters for a MEMS resonator. Most MEMS resonators are dominated by thermoelastic dissipation (TED). This paper demonstrates that the TED in a disk resonator that is made of (111) single-crystal silicon is surpassed by clamping loss. The stiffness-mass decoupling design method, combined with reducing the beam width, was used to engineer high QTED. Experiments show that Q of the (111) disk resonator have an upper boundary that is determined by the clamping loss caused by the unbalanced out-of-plane displacement. The origin of the out-of-plane displacement is explained by theory and simulation.
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