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Local x-ray diffraction measurements reveal crystal imperfections. A specialized quartz conditioning crystal enhances resolution, making fabrication flaws visible for improved plasma diagnostics.

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Area of Science:

  • Plasma diagnostics
  • X-ray optics
  • Materials science

Background:

  • Bent crystals are used in plasma diagnostics, diffracting X-rays across the entire crystal.
  • Analyzing the overall spectrum or image of diffracted X-rays is insufficient for identifying individual crystal performance issues.

Purpose of the Study:

  • To develop a method for measuring X-ray diffraction locally with high resolution.
  • To identify specific reasons for performance variations in bent crystals used for plasma diagnostics.

Main Methods:

  • Utilized an x-ray topography setup at the Advanced Photon Source (APS) beamline 1-BM.
  • Employed a specially designed quartz conditioning crystal to improve radiation quality.

Main Results:

  • The new method enabled local diffraction measurements with necessary resolution.
  • Standard synchrotron X-ray optics were insufficient for this task.
  • Worrisome diffraction features were eliminated, and minor fabrication flaws became highly visible.

Conclusions:

  • Local X-ray diffraction measurement with a specialized setup provides superior insight into bent crystal performance.
  • This technique is crucial for understanding and improving crystals used in plasma diagnostics.