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A support vector regression method for efficiently determining neutral profiles from laser induced fluorescence data.

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This study integrates machine learning with plasma physics models to determine atomic profiles using laser-induced fluorescence. This approach enhances accuracy by incorporating measurement errors, aiding plasma diagnostics.

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Area of Science:

  • Plasma Physics
  • Atomic Physics
  • Machine Learning

Background:

  • Helicon plasmas are crucial in various applications, but accurately diagnosing their properties, like atomic profiles, remains challenging.
  • Collisional Radiative (CR) models are essential for understanding plasma behavior but are sensitive to input parameter uncertainties.
  • Laser-Induced Fluorescence (LIF) is a powerful diagnostic tool, but its interpretation can be complex.

Purpose of the Study:

  • To develop an efficient method for determining Ar i (Argon ion) profiles in helicon plasmas.
  • To integrate a Support Vector Regression (SVR) machine learning model with a CR model for enhanced plasma diagnostics.
  • To improve the robustness of CR models by incorporating measurement errors from LIF data.

Main Methods:

  • A Support Vector Regression (SVR) model was trained using data from a Helicon-Cathode (HelCat) linear plasma device.
  • The SVR model was integrated with a Collisional Radiative (CR) model to interpret metastable-pumped Laser Induced Fluorescence (LIF) measurements.
  • Radial points from plasma measurements served as input features for the SVR, mapping to parameters of a sigmoidal-type function as output.

Main Results:

  • The integrated SVR-CR model successfully determined Ar i profiles from LIF measurements.
  • The machine learning approach allowed for efficient exploration of the CR model's input parameter space.
  • The method inherently incorporated uncertainties from probe and LIF measurements, improving reliability.

Conclusions:

  • The developed SVR-CR method offers an efficient and robust approach for determining atomic profiles in plasmas.
  • This technique can be adapted for other LIF pumping schemes and plasma devices.
  • The method holds potential for validating electron temperature and density profiles when neutral or ion profiles are known.