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Dual-pass upgrade to the Thomson scattering diagnostic on the Prototype-Material Plasma Exposure eXperiment
N Kafle1, T M Biewer2, D C Donovan1
1Nuclear Engineering, The University of Tennessee, Knoxville, Tennessee 37996, USA.
The upgraded Thomson scattering diagnostic on the Prototype-Material Plasma Exposure eXperiment now measures electron temperature and density at two axial locations. This upgrade improves plasma gradient diagnostics and enhances measurement accuracy by subtracting background light.
Area of Science:
- Plasma physics
- Fusion energy research
- Diagnostic techniques
Background:
- The Prototype-Material Plasma Exposure eXperiment (PMPX) requires precise measurements of plasma parameters.
- Understanding axial gradients is crucial for optimizing plasma confinement and performance.
- Previous diagnostics had limitations in spatial resolution and simultaneous multi-point measurements.
Purpose of the Study:
- To upgrade the Thomson scattering (TS) diagnostic system on PMPX.
- To enable simultaneous measurement of electron temperature (Te) and density (ne) at two axial locations.
- To improve the diagnosis of axial Te and ne gradients.
Main Methods:
- Implemented a double-pass laser beamline for Thomson scattering.
- Utilized an intensified CCD camera with double triggering to separate TS signals from background light.
- Increased the number of radial sampling points in both the central chamber and target regions.
Main Results:
- Successfully measured Te and ne at two axial locations (central chamber and target region).
- Observed distinct plasma parameter ranges: Te ≈ 4-15 eV and ne ≈ 2-4 × 10^19 m^-3 in the central chamber; Te ≈ 1-2 eV and ne ≈ 1-2 × 10^19 m^-3 in the target region.
- Enhanced measurement accuracy by subtracting plasma background light, including emission lines and bremsstrahlung.
Conclusions:
- The upgraded TS diagnostic effectively diagnoses axial electron temperature and density gradients.
- The enhanced spatial resolution and improved signal-to-noise ratio provide more reliable plasma characterization.
- Further optimization of the diagnostic setup can lead to even more precise plasma measurements.
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