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Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
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Implications of X-ray beam profiles on qualitative and quantitative synchrotron micro-focus X-ray fluorescence

Alexander P Morrell1, J Frederick W Mosselmans2, Kalotina Geraki2

  • 1Aston Institute of Materials Research, School of Engineering, University of Aston, Birmingham B4 7ET, UK.

Journal of Synchrotron Radiation
|November 9, 2018
PubMed

Keywords:
X-ray fluorescence microscopyX-ray fluorescence spectroscopy artefacts

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