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Thermoelectric stack sample cooling modification of a commercial atomic force microscopy
A Del Moral1, J C González-Rosillo2, A Gómez2
1Instituto de Microelectrónica de Barcelona, Centro Nacional de Microelectrónica (CSIC), Campus U.A.B., Bellaterra, Barcelona 08193, Spain; Institut de Ciència dels Materials de Barcelona, UAB Campus, Bellaterra 08193, Spain.
Ultramicroscopy
|November 16, 2018
Summary
This study introduces a new Atomic Force Microscopy accessory for temperature-dependent experiments, enabling nanoscale material analysis down to -61.4°C. The system demonstrates precise control for studying phenomena like resistive switching in multiferroic thin films.
Area of Science:
- Materials Science
- Nanotechnology
- Surface Science
Background:
- Temperature-dependent experiments are crucial for understanding nanoscale material properties.
- Atomic Force Microscopy (AFM) is a key technique for surface analysis.
- Studying phenomena like Curie temperature and resistive switching requires controlled temperature environments.
Purpose of the Study:
- To develop and present a novel thermoelectric cooling stage for AFM.
- To enable temperature-dependent nanoscale experiments down to -61.4°C.
- To assess the impact of cooling system vibrations on AFM measurements.
Main Methods:
- Integration of a four-unit thermoelectric cooling stage into a Keysight 5500LS AFM.
- Characterization of cantilever static deflection noise and temperature dependence.
- Analysis of resistive switching phenomena in a La0.7Sr0.3MnO3-y thin film sample.
Main Results:
- Achieved a sample temperature range down to -61.4°C with low noise.
- Quantified the contribution of liquid cooling pump vibrations to cantilever deflection noise.
- Demonstrated the equipment's capability by analyzing temperature-dependent resistive switching.
Conclusions:
- The developed thermoelectric cooling stage is compatible with AFM and suitable for nanoscale temperature-dependent studies.
- The system allows for detailed investigation of phase transitions and electronic properties.
- This equipment enhances AFM capabilities for materials research.
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