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Updated: Feb 1, 2026

Focused Ion Beam Lithography to Etch Nano-architectures into Microelectrodes
Published on: January 19, 2020
Development of an ion beam detector for the atomic beam probe diagnostic
1Institute of Plasma Physics of the Czech Academy of Sciences, Prague, Czech Republic.
Abstract:
The atomic beam probe diagnostic concept aims at measuring the edge magnetic field and through that edge current distribution in fusion plasmas by observing trajectories of an ion beam stemming from a diagnostic neutral beam. The diagnostic potentially has microsecond scale time resolution and can thus prove to be a powerful option to study fast changes in the edge plasma. A test detector has been installed on the COMPASS tokamak as an extension of the existing lithium beam diagnostic system. It employs a relatively simple concept of an array of conductive detection plates measuring the incident ion current, which is then amplified and converted to a voltage signal. The aim of the test detector is to experimentally examine the idea of the diagnostic and provide background data for design and installation of a final detector. Also, a numerical code based on the CUDA parallel computing platform has been developed for modeling lithium ion trajectories in the given COMPASS plasma discharges. We present the developments of the detector design and test measurements of the diagnostic performed both in a laboratory beam system and on the COMPASS tokamak.
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