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Updated: Feb 1, 2026

Focussed Ion Beam Milling and Scanning Electron Microscopy of Brain Tissue
Published on: July 6, 2011
Zhiwu Wang1, Jian Zhuang1, Zijun Gao1
1Key Laboratory of Education Ministry for Modern Design Rotor-Bearing System, Xi'an Jiaotong University, Xi'an 710049, China.
This study introduces a Compressed Sensing (CS)-based scanning method to accelerate Scanning Ion Conductance Microscopy (SICM) imaging. The new CS-based mode significantly speeds up imaging without compromising image quality, enabling better study of dynamic biological processes.
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