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Scanning tunneling microscopy and atomic force microscopy: application to biology and technology
P K Hansma1, V B Elings, O Marti
1Department of Physics, University of California, Santa Barbara 93106.
Science (New York, N.Y.)
|October 14, 1988
Summary
Scanning probe microscopy, including scanning tunneling microscopy (STM) and atomic force microscopy (AFM), achieves atomic-level surface detail. These techniques image diverse materials from semiconductors to biological samples and technological components.
Area of Science:
- Surface Science
- Nanotechnology
- Microscopy
Background:
- Scanning probe microscopy offers atomic-level surface resolution.
- Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) are key techniques.
- Imaging challenges exist for non-conductive and biological samples.
Purpose of the Study:
- To illustrate the capabilities of STM and AFM for atomic and molecular resolution imaging.
- To showcase applications in materials science, biology, and technology.
- To demonstrate overcoming limitations in imaging biological samples.
Main Methods:
- Utilized scanning tunneling microscopy (STM) for conductive samples.
- Employed atomic force microscopy (AFM) for non-conductive samples.
- Applied metal coatings and replicas for imaging biological materials with STM.
Main Results:
- Achieved atomic resolution images of graphite, organic conductors, and adsorbed oxygen atoms.
- Obtained molecular resolution images of non-conducting organic monolayers and amino acid crystals.
- Generated images of technological items like optical disks, diffraction gratings, and magnetic heads.
Conclusions:
- STM and AFM provide unprecedented surface detail across various scientific and technological fields.
- AFM offers advantages for imaging non-conductive materials, including biological samples.
- These microscopes are valuable tools for both fundamental research and technological advancement, with STM improving device quality.