Development of a Micro/Nano Probing System Using Double Elastic Mechanisms
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Published on: August 28, 2011
Rui-Jun Li1, Peng Xu2, Peng-Yu Wang3
1School of Instrument Science and Opto-electronics Engineering, Hefei University of Technology, Hefei 230009, China. RJ-Li@hfut.edu.cn.
Abstract:
To meet the requirement of high precision measurement of coordinate measurement machine system, a compact microprobe has been designed for 3D measurement in this paper. Aiming to reduce the influences of signal coupling during the probing process, the probe has been designed by adopting two elastic mechanisms, in which the horizontal and vertical motions of the probe tip can be separated by differential signals of quadrant photodetectors in each elastic mechanism. A connecting rod has been designed to transfer the displacement of the probe tip in vertical direction from lower to upper elastic mechanisms. The sensitivity models in horizontal and vertical directions have been established, and the sensor sensitivity has been verified through experiments. Furthermore, the signal coupling of three axes has been analyzed, and mathematical models have been proposed for decoupling. The probing performance has been verified experimentally.
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