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Subsurface Defect Localization by Structured Heating Using Laser Projected Photothermal Thermography
Published on: May 15, 2017
Deying Xia1, Shawn McVey1, Chuong Huynh1
1Carl Zeiss SMT Inc, PCS Integration Center , One Corporation Way , Peabody , Massachusetts 01960 , United States.
Helium ion microscopy (HIM) with passive voltage contrast (PVC) offers a damage-free method for nanoscale failure analysis in electronic devices. This technique enables precise defect localization and circuit editing, improving semiconductor analysis.
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