One-dimensional parallax-free position-sensitive detector for diffraction measurements based on a home-made thin
Shi Chen1, Hongbang Liu2, Qian Liu1
1University of Chinese Academy of Sciences, Beijing 100049, People's Republic of China.
Journal of Synchrotron Radiation
|January 19, 2019
Summary
A novel parallax-free gas diffraction meter utilizing a curved thick gaseous electron multiplier (THGEM) was developed. This detector achieves high angular resolution for powder diffraction analysis, enabling precise material characterization.
Area of Science:
- Materials Science
- Particle Detectors
- Synchrotron Radiation
Background:
- Powder diffraction is crucial for material analysis.
- Parallax errors can limit the accuracy of gas detectors.
- Advancements in detector technology are needed for higher precision.
Purpose of the Study:
- To develop a large, parallax-free gas diffraction meter.
- To improve angular resolution in powder diffraction measurements.
- To achieve a broad dynamic range for enhanced data acquisition.
Main Methods:
- Utilized a thinner-THGEM (thick gaseous electron multiplier) with a 200 µm thickness, shaped into a curve.
- Designed a detector with a 48° open angle, positioned 20 cm from powder samples.
- Employed a 128-channel direct-current front-end electronics board for an 8 keV BSRF beamline.
Main Results:
- Achieved a parallax-free measurement capability by curving the THGEM.
- Obtained an angular resolution of 0.148 ± 0.081° for TiO₂ and SnO₂ powder samples.
- Demonstrated a broad dynamic range of approximately 10⁷ by combining gas gain and electronic dynamic range.
Conclusions:
- The developed gas diffraction meter effectively eliminates parallax errors.
- The detector provides high-precision measurements consistent with standard powder diffraction data.
- The technology offers a significant advancement for synchrotron-based powder diffraction studies.
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