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Updated: Jan 29, 2026

Focussed Ion Beam Milling and Scanning Electron Microscopy of Brain Tissue
Published on: July 6, 2011
Author Correction: The first annotated set of scanning electron microscopy images for nanoscience
Rossella Aversa1, Mohammad Hadi Modarres2, Stefano Cozzini3,4
1CNR-IOM Istituto Officina dei Materiali, c/o SISSA, via Bonomea 265, 34136, Trieste, Italy. aversa@iom.cnr.it.
Duplicate images were identified and removed from the Majority and 100% Datasets. Updated versions of these crucial research datasets are now available, ensuring data integrity for future scientific endeavors.
Area of Science:
- Data Science
- Image Analysis
- Research Data Management
Background:
- The original Majority Dataset and 100% Dataset contained duplicate images.
- This duplication was discovered during subsequent data analysis.
Purpose of the Study:
- To correct and re-release the Majority Dataset and 100% Dataset.
- To ensure the integrity and accuracy of the research data.
Main Methods:
- Re-analysis of the Majority Dataset (Data Citation 3) and 100% Dataset (Data Citation 4).
- Identification and removal of all duplicate images from both datasets.
- Updating the data repository with corrected versions.
Main Results:
- All duplicate images have been successfully removed from both the Majority Dataset and the 100% Dataset.
- Corrected versions of the datasets are now accessible via new DOIs.
- The Data Descriptor has been updated to reflect these corrections.
Conclusions:
- The corrected datasets provide a reliable foundation for research.
- Ensuring data quality through duplicate removal enhances scientific reproducibility.
- The updated datasets are readily available for the scientific community.
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