Related Experiment Video
Updated: Jan 29, 2026

Electrospray Deposition of Uniform Thickness Ge23Sb7S70 and As40S60 Chalcogenide Glass Films
Published on: August 19, 2016
๏ฟฝ๏ฟฝm-resolution thickness distribution measurement of transparent glass films by using a multi-wavelength phase-shift
Abstract:
In this paper, a precise phase-shift extraction method was introduced for the first time to measure the thickness distribution of transparent glass films. A spatial light modulator modulated the phases of the incident laser in a large lateral shearing interferometer. The phase shifting caused by the thickness of the films can be extracted ranging from 0 to 2ฯ, in a recursive way suitable for real-time implementation. Incident lasers with different wavelengths were utilized to measure the spatial distribution of the thickness of the films, and they can be larger than one wavelength of the incident light. Both artificial and experimental results have verified that the resolution of the thickness measurement reaches up to 1 ๐m.
More Related Videos
Related Concept Videos
Relation Between the Distributed Load and Shear
The de Broglie Wavelength
Power Distribution in Three-phase and Single Phase Circuits
Single-Phase Power Distribution:
Single-phase circuits are typical in household settings;...
Extraction: Partition and Distribution Coefficients
For extracting a solute from an aqueous phase into an...
The Looking Glass Self
Extraction: Advanced Methods

