Related Experiment Video
Updated: Jan 29, 2026

High-Accuracy Correction of 3D Chromatic Shifts in the Age of Super-Resolution Biological Imaging Using Chromagnon
Published on: June 16, 2020
Measuring chromatic aberration in LEEM/PEEM
1IBM T.J. Watson Research Center, 1101 Kitchawan Road, P.O. Box 218, Yorktown Heights, NY 10598, United States.
Abstract:
Measurement of chromatic aberration in a Low Energy Electron Microscope (LEEM) or Photo Electron Emission Microscope (PEEM) is necessary for quantitative image interpretation, and for accurate correction of chromatic aberration in an aberration-corrected instrument. While methods have been developed for measuring the spherical aberration coefficient, C3, measuring the chromatic aberration coefficient, Cc, remains a more difficult task. Here a novel method is introduced to simplify such measurements. The viability and accuracy is demonstrated using detailed electron-optical ray-tracing calculations. Experimental results show that the method is easily reduced to practice.
Related Concept Videos
Measures of Central Tendency
Measurement: Standard Units
Measuring Reaction Rates
Uncertainty in Measurement: Significant Figures
Measurement: Derived Units
Units of Measurement
There are various well-known historical measurement systems, such as the Babylonian system, the Roman system, the Egyptian system, the Olympian system, the British system, and the Indus...

