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Updated: Jan 27, 2026

Non-invasive 3D-Visualization with Sub-micron Resolution Using Synchrotron-X-ray-tomography
Published on: May 27, 2008
Pulse picking in synchrotron-based XPEEM
Lucia Aballe1, Michael Foerster1, Meritxell Cabrejo1
1ALBA Synchrotron, Carrer de la llum 2-26, 08290 Cerdanyola del Valles, Spain.
Abstract:
We report on a simple and cost-effective device for high-speed gating in photoemission electron microscopy (PEEM) with pulsed photon sources. This device is based on miniaturized electrode plates, which deflect the photoelectron beam inside the imaging column of the microscope so that it is either accepted or blocked in its path towards the detector. The gating device is optimized for installation on the Elmitec SPELEEM III microscope. Due to the compact design, it can be driven by voltage pulses of low amplitude (few volts), delivered by commercially available signal generators. Most notably, our device allows for stroboscopic data collection with on-time of less than 10 ns and at a rate in the range from 1 MHz to 250 MHz, making it suitable for usage in both hybrid and standard multi-bunch operation of the synchrotron ring. We demonstrate applications of pump-probe imaging at high lateral resolution, namely magnetic imaging and PEEM imaging of surface acoustic waves.
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