The Hall Effect
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Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Jefferson F D F Araujo1, Andre L A Reis2, Vanderlei C Oliveira3
1Department of Physics, Pontifical Catholic University of Rio de Janeiro, Rio de Janeiro 22451-900, Brazil. jferraz@fis.puc-rio.br.
We enhanced a magnetic scanning microscope for detailed mineral analysis in geological samples. This improved system offers submillimeter resolution and high sensitivity for magnetic property measurements.
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