Effect of High Salt Concentration (HSC) on Structural, Morphological, and Electrical Characteristics of Chitosan...

Chitosan (CS) films doped with sodium triflate (NaTf) were prepared by the solution cast technique. The structural and morphological behaviors of the samples were examined by X-ray diffraction (XRD) and scanning electron microscopy (SEM) techniques. The XRD patterns were deconvoluted to estimate the degree of crystallinity of the samples. The SEM micrograph showed the crystalline structure of the sample contained 50 wt % of NaTf salt. The disappearance of broad peaks of chitosan at 2θ ≈ 21° and 2θ ≈ 32° confirmed the occurrence of ion association at 50 wt % of NaTf salt. In impedance plots, a low frequency spike region and a high frequency semicircle, were distinguishable for low salt concentrations. The highest ambient temperature direct current (DC) electrical conductivity obtained for CS:NaTf was found to be 2.41 × 10^-⁴ S/cm for the sample containing 40 wt % of NaTf salt. The role of lattice energy of salts on DC ionic conductivity was also discussed. The temperature dependence of DC conductivity was found to follow the well-known Arrhenius relationship. From the alternating current (AC) conductivity spectra, three distinct regions were recognized for the samples with NaTf salt concentration ranging from 10 wt % to 30 wt %. The plateau region of AC spectra was used to estimate the DC conductivity.