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A model for multi-view ultrasonic array inspection of small two-dimensional defects.

Nicolas Budyn, Rhodri L T Bevan, Jie Zhang

IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control

|April 17, 2019

Summary

A new ray-based forward model simulates ultrasonic multi-view total focusing method (TFM) responses for defects. This model accurately predicts defect imaging and offers significant speed improvements over complex simulations.

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Area of Science:

Non-destructive testing
Ultrasonic imaging
Computational modeling

Background:

Multi-view total focusing method (TFM) utilizes internal reflections and mode conversions for ultrasonic imaging.
Accurate modeling of defect responses is crucial for advancing TFM-based detection and characterization.

Purpose of the Study:

To develop and validate a ray-based forward model for simulating defect responses in multi-view TFM.
To compare the model's performance against finite-element simulations and experimental data.

Main Methods:

A ray-based forward model was developed for small two-dimensional defects.
The model was validated using finite-element simulations and experimental data for side-drilled holes, notches, and cracks.
A simplified single-frequency approximation of the model was also derived and evaluated.

Main Results:

The ray-based forward model demonstrated good agreement with multi-frequency simulations.
The single-frequency approximation achieved comparable results to the multi-frequency model.
Significant speed-up of several orders of magnitude was observed with the simplified model.

Conclusions:

The developed ray-based forward model is a viable tool for simulating defect responses in multi-view TFM.
The simplified single-frequency model offers a computationally efficient alternative without substantial loss of accuracy.
This work lays the foundation for developing advanced TFM defect detection and characterization techniques.