A Technology-Computer-Aided-Design-Based Reliability Prediction Model for DRAM Storage Capacitors

Woo Young Choi1, Gyuhan Yoon2, Woo Young Chung3

  • 1Department of Electronics Engineering, Sogang University, Seoul 04107, Korea. wchoi@sogang.ac.kr.

Micromachines
|April 20, 2019
PubMed

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