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Updated: Jan 26, 2026

Detection of Architectural Distortion in Prior Mammograms via Analysis of Oriented Patterns
Published on: August 30, 2013
Pattern matching analysis of electron backscatter diffraction patterns for pattern centre, crystal orientation and
Tomohito Tanaka1, Angus J Wilkinson2
1Department of Materials, University of Oxford, Parks Road, Oxford, OX1 3PH, UK; Nippon Steel & Sumitomo Metal Corporation, 20-1 Shintomi, Futtsu, Chiba, Japan.
Abstract:
Pattern matching between target electron backscatter patterns (EBSPs) and dynamically simulated EBSPs was used to determine the pattern centre (PC) and crystal orientation, using a global optimisation algorithm. Systematic analysis of error and precision with this approach was carried out using dynamically simulated target EBSPs with known PC positions and orientations. Results showed that the error in determining the PC and orientation was <10-5 of pattern width and <0.01° respectively for the undistorted full resolution images (956 × 956 pixels). The introduction of noise, optical distortion and image binning was shown to have some influence on the error although better angular resolution was achieved with the pattern matching than using conventional Hough transform-based analysis. The accuracy of PC determination for the experimental case was explored using the High Resolution (HR-) EBSD method but using dynamically simulated EBSP as the reference pattern. This was demonstrated through a sample rotation experiment and strain analysis around an indent in interstitial free steel.
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