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Updated: Jan 25, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
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Experimentally obtained and computer-simulated X-ray non-coplanar 18-beam pinhole topographs for a silicon crystal

Kouhei Okitsu1, Yasuhiko Imai2, Yoshitaka Yoda2

  • 1Nano-Engineering Research Center, Institute of Engineering Innovation, Graduate School of Engineering, The University of Tokyo, 2-11-16 Yayoi, Bunkyo-ku, Tokyo 113-8656, Japan.

Acta Crystallographica. Section A, Foundations and Advances
|May 2, 2019
PubMed

Keywords:
X-ray diffractiondynamical theorymultiple reflectionn-beam reflectionphase problemprotein crystallography

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